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A study of the optical and polarisation properties of InGaN/GaN multiple quantum wells grown on a-plane and m-plane GaN substrates

机译:InGaN / GaN多晶硅的光学和偏振特性研究   量子阱生长在a面和m面GaN衬底上

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摘要

In this paper we report on a comparative study of the low temperatureemission and polarisation properties of InGaN/GaN quantum wells (QWs) grown onnonpolar a-plane and m-plane free-standing bulk GaN substrates where the Incontent varied from 0.14 to 0.28 in the m-plane series and 0.08 to 0.21 for thea-plane series. The low temperature photoluminescence spectra from both sets ofsamples are very broad with full width at half-maximum height increasing from81 to 330 meV as the In fraction increases. Comparative photoluminescenceexcitation spectroscopy indicates that the recombination mainly involvesstrongly localised carriers. At a temperature of 10 K the degree of linearpolarisation of the a-plane samples is much smaller than of the m-planecounterparts and also varies across the spectrum. From polarisation-resolvedphotoluminescence excitation spectroscopy we measured the energy splittingbetween the lowest valence sub-band states to lie in the range of 23-54 meV forboth a-and m-plane samples in which we could observe distinct exciton featuresin the polarised photoluminescence excitation spectroscopy. Thus, the thermaloccupation of a higher valence subband cannot be responsible for the reductionof the degree of linear polarisation. Time-resolved spectroscopy indicates thatin a-plane samples there is an extra emission component which at least partlyresponsible for the reduction in the degree of linear polarisation.
机译:在本文中,我们报告了在非极性a平面和m平面独立式大块GaN衬底上生长的InGaN / GaN量子阱(QW)的低温发射和极化特性的对比研究,其中In含量在0.14到0.28之间变化。 m平面系列,thea平面系列为0.08至0.21。两组样品的低温光致发光光谱都非常宽,随着In分数的增加,半高处的全宽度从81 meV增加到330 meV。比较的光致发光光谱表明,重组主要涉及强定位的载体。在10 K的温度下,a平面样本的线性极化程度远小于m平面对应部分,并且在整个光谱范围内也会变化。从偏振分辨光致发光激发光谱中,我们测量了a平面和m平面样品的最低价子带状态之间的能量分配在23-54 meV范围内,其中我们可以在偏振光致发光激发光谱中观察到不同的激子特征。因此,更高价子带的热占据不能导致线性极化程度的降低。时间分辨光谱法表明,在一个平面样品中,存在额外的发射成分,该成分至少部分负责线性极化度的降低。

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